Products

■ Optical Analysis Instruments
325 nm Laser-Excited Photoluminescence Measurement System
MUVPL-325-2W		 Near-Infrared Photoluminescence Measurement System
MNIRPL-532
Cryogenic Deep-Ultraviolet Photoluminescence Measurement System
MDUVPL-213-LT		 Cryogenic Near-Infrared Photoluminescence Measurement System
MNIRPL-532-LT
Cryogenic Infrared Photoluminescence Measurement System
MIRPL-532-LT		 UV-Excited Photoluminescence Measurement System
MUVPL-193/213/325
UV-VIS Microscopic Imaging Spectroscopy System
MISM-08		 Microscopic Imaging System
MISM-07
Microscopic Imaging Spectroscopy System
MISM-05		 Microscopic Emission and Transmittance Spectroscopy System
MISM-06
Fiber Adapter for Microspectroscopy
MMSFA-02		 Photon-Counting Spectroscopic Measurement System
MPCSM-01
Variable-Temperature Vacuum-Ultraviolet Spectroscopy System
MVUV-01		 Vacuum-Ultraviolet Fluorescence Excitation System
Model: MVUV-03
Microspectroscopy Microscope
MMSM-UV-NIR		 PL & Raman Simultaneous Mapping System
MPLARSMS-266-785
Reflective Light Collection Unit
MLCOA-W200-700-PM-F203.2-1F-SMA		 Universal Sample Holder Unit
MUSHA-7070-XYZ

■ Semiconductor Characterization Systems
Overview of Probe Station Products Manual Probe Station for Optical Characterization
MMPS-50-IVLS
Manual Probe Station
MMPS-SV01		 Manual Probe Station
MMPS-50
Manual Probe Station for Optical Characterization
MMP-ILS01		 Compact Probe Station Unit
MCPU-140-23W
Manual Probe Station for External Quantum Efficiency Measurements
MMPS-50EQE		 Microwave Test Fixture
MMWTF-40
Semi-Automatic Probe Station for 4-Inch Wafers
MSAPS-100		 Wafer-Level LED Test System
MLEDTS-50
NIR LED Test System
MLEDTS-50NIR		 Laser Diode Test System
MLDTS-10N-1A
Micro-LED Emission Pattern Microscopy System
MMLEDMSS-NUV-VIS-BP		 Laser Heterodyne Photothermal Displacement Microscopic Mapping System
MLHPDMS-633
VSL Optical Gain Measurement System
MVSLOGMS-266		 Deep-Ultraviolet Microscope for NFP Measurement
MDUVMS-275
Microscopic Time-Resolved Free Carrier Absorption Measurement System
MTRFCA-355		 Deep-Level Measurement System for Nitride Semiconductors
MDLOS-350-1600

■ Low- and High-Temperature Test Systems
Liquid Nitrogen Cryostat for Optical Measurements
MLN2CS-20		 Closed-Cycle Cryostat for Optical Measurements
MCCHeC-4K
Vacuum Heating Chamber for Optical Measurement
MVHC-3040
 

■ Optical Instruments
Micro-Area Laser Irradiation Microscope
MMRLIM-UV-NIR		 Dark Boxes / Light-Shielding Enclosures
MDB Series
Light-Shielding Optical Enclosures / Dark Boxes
MOE Series		 Variable Optical Attenuator
Model: MVATT Series
Adapter for SMA Optical Connectors
MSMACA-40