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About Mutsumi Corporation

Founded in 1996, Mutsumi Corporation develops characterization systems for advanced materials and devices, including semiconductor materials, based on laser-based measurement technology. Our products include photoluminescence measurement systems, Raman spectrometers, probe stations for optical characterization, and photothermal displacement measurement systems, supporting cutting-edge research and development.

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New Products

Wafer-Level LED Test System

Wafer-Level LED Test System

This pulse-driven LED test system enables high-precision measurement of I-V-L characteristics, emission spectra, and other parameters of LED chips at the wafer level.

 

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