Compact Probe Station Unit
MCPU-140-23W |
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| This compact probe station is designed to evaluate light-emitting devices by supplying current to them. While observing the device through a stereo microscope, the probe needles are aligned with the device electrodes and brought into contact to supply current. Its portable design allows the unit to be used with other measurement instruments while maintaining contact between the electrodes and probe needles. This enables a variety of measurements, including current–optical output characteristics, wavelength measurements, and emission image analysis. A synthetic quartz window allows light emission to be observed from the back side.
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■Specifications |
| Probe Needles |
Material: Tungsten
Tip angle: 5°
Tip radius: 25 μm |
| Manipulators |
Total stroke (X, Y, Z): 10 mm per axis
Travel per rotation (X, Y, Z): 250 μm per axis
Number installed: 2
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| Back-Side Observation Window |
Material: Synthetic quartz
Thickness: 1 mm
Clear aperture: 23 mm
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| Dimensions |
W140 mm × D100 mm × H63.8 mm
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| *Specifications and appearance are subject to change without notice for product improvement. |
