Time-resolved pholuminescence systems |
TCSPC Fluorescence Lifetime Spectrometer
![TCSPC Fluorescence Lifetime Spectrometer](images_products/mtcspc_m.jpg)
The TCSPC Fluorescence Lifetime Spectrometer is ahigh performance and simple-to-use system for Time-resolved Photoluminescence (TRPL) measurements. |
Time-Correlated Single Photon Counting Module
![Time-Correlated Single Photon Counting Module](images_products/tcspc_m.jpg)
The MTCSPC is a high-performance, compact, easy-to-use module for measuring fluorescence lifetimes based on the technique of Time Correlated Single Photon Counting (TCSPC). |
Picosecond Pulsed Diode Lasers
![Picosecond Pulsed Diode Lasers](images_products/Pulsed Laser_m.jpg)
This is a stand-alone driver with a picosecond pulsed laser diode heads from 375 to 1550 nm. The laser heads can emit light pulses as short as from 40 psec to 100 psec FWHM.
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Photoluminescence measurement systems |
Photoluminescence Measurement Systems
![PL measurement system](images_products/213nm_pl_m.jpg)
Photoluminescence spectroscopy is a efficient, contactless and nondestructive method of probing the electronic structure of materials, especially for a direct-band gap semiconductor. |
Microphotoluminecence Measurement System
![N2 laser PL](images_products/n2laser-pl_m.jpg)
Microphotoluminescence spectroscopy is a powerful technique for investigating the optical and electronic properties of microscopic structure. |
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LED and LD measurement systems |
LED Wafer/Chip Manual Probe Station
![Probe station](images_products/probe_station_m.jpg)
MMP-ILS01 is designed for probing LED wafers/chips to measure the electrical and optical characteristics. This
probe station can be used for back-emission LEDs and
Standard LEDs. |
UV LED Forward Spectral Flux Measurement System
![Forward Spectral Flux Measurement System](images_products/fsfms_m.jpg)
The MFSFMS-250-800 is designed to measure the
forward spectral flux emited from UV LEDs. |
In-situ Curvature Measurement System
![In-situ Curvature Measurement System](images_products/mwcm-660_m.jpg)
MWCM-660 provides real-time measuremnts of wafer curvature during growth.Time-to-distance conversion technique achieves both high-resolutiont and wide dynamic range. |